Manoj Sachdev, José Pineda de Gyvez, "Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits"

Springer; 2 ed | 2007 | ISBN: 0387465464 | 328 pages | PDF | 5,5 MB

Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challenges for IC testing. As the variation of fundamental parameters such as channel length, threshold voltage, thin oxide thickness and interconnect dimensions goes well beyond acceptable limits, new test methodologies and a deeper insight into the physics of defect-fault mappings are needed. In Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits state of the art of defect-oriented testing is presented from both a theoretical approach as well as from a practical point of view. Step-by-step handling of defect modeling, defect-oriented testing, yield modeling and its usage in common economics practices enables deeper understanding of concepts.

The progression developed in this book is essential to understand new test methodologies, algorithms and industrial practices. Without the insight into the physics of nano-metric technologies, it would be hard to develop system-level test strategies that yield a high IC fault coverage. Obviously, the work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies. Test and design practitioners from academia and industry will find that Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits lays the foundations for further pioneering work.


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Handbook of Medical Imaging: Processing and Analysis (Biomedical Engineering), by Isaac Bankman

Academic Press; 1st edition | English | October 15, 2000 | ISBN: 0120777908 | 911 Pages | PDF | 21,1 Mb

Description : This book is an almost complete collection of algorithms in computer processing of medical images. As an addition to computer processing litterature, this book fills a gap much in need of being closed. The text contains three levels of informating, a scholarly review of each topic, a professional review of methods and their application, and, finally, several chapters for each subject of thorough mathematical descriptions of individual methods and approaches, with useful examples from "real life". The book is divided into six sections: I Enhancement, describing the methods available for enhancing, e.g., noise reduction, window/level processing and grayscale manipulations. II Segmentation, dividing images into usefull subsets for further processing, III Quantification, measuring on images. IV Registration, making different images, both from between different subjects and between different modalities as well as between individuals having imaging studies done on separate occasions. V Visualization, rendering images for views in several different formats, including virtual endoscopies and volume rendering techniques. VI Compression, Storage and Communication, describing methods related to DICOM storage facilities and files, compressing, normalizing grayscale for optimal storage and removing nuisances from images. This book is contains a wealth of information in a handy format, making it an invaluable companion for anyone working in the field of medical image processing. It is also a source of vast information for the interested radiologist, although some may find the extend of mathematical understanding required somewhat overwhelming. Even if the DICOM part of this book does not comprise a large part, the book may be worth its price for this section alone.


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